Memory corruption while processing MBSSID beacon containing several subelement IE.
Memory corruption while parsing beacon/probe response frame when AP sends more supported links in MLIE.
Information disclosure while handling T2LM Action Frame in WLAN Host.
Memory corruption when allocating and accessing an entry in an SMEM partition.
Information disclosure while handling SA query action frame.
INformation disclosure while handling Multi-link IE in beacon frame.
Memory corruption due to improper access control in Qualcomm IPC.
Transient DOS while parsing the ML IE when a beacon with length field inside the common info of ML IE greater than the ML IE length.
Transient DOS while parsing the MBSSID IE from the beacons, when the MBSSID IE length is zero.
Transient DOS while parsing the multiple MBSSID IEs from the beacon, when the tag length is non-zero value but with end of beacon.
Transient DOS while parsing fragments of MBSSID IE from beacon frame.
Transient DOS while parsing the received TID-to-link mapping element of the TID-to-link mapping action frame.
Transient DOS while parsing the received TID-to-link mapping action frame.
Transient DOS when driver accesses the ML IE memory and offset value is incremented beyond ML IE length.
Transient DOS while parsing probe response and assoc response frame when received frame length is less than max size of timestamp.
Information disclosure while handling beacon or probe response frame in STA.
Information disclosure while handling beacon probe frame during scan entry generation in client side.
Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
Transient DOS while parsing ESP IE from beacon/probe response frame.
Transient DOS while parsing SCAN RNR IE when bytes received from AP is such that the size of the last param of IE is less than neighbor report.
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
Transient DOS while parsing the multi-link element Control field when common information length check is missing before updating the location.
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
Transient DOS while parsing noninheritance IE of Extension element when length of IE is 2 of beacon frame.
Possible out of bound read due to improper validation of IE length during SSID IE parse when channel is DFS in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking
Possible out of bound write due to improper validation of number of timer values received from firmware while syncing timers in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired Infrastructure and Networking
Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length.
Memory corruption while parsing the ML IE due to invalid frame content.
Memory corruption may occour occur when stopping the WLAN interface after processing a WMI command from the interface.
Memory corruption during management frame processing due to mismatch in T2LM info element.